In Wide Bandgap (WBG) power electronic circuits employing SiC or GaN devices, parasitic elements introduced by Current Viewing Resistors (CVRs) and associated measurement accessories critically affect drain current fidelity and circuit dynamics. These parasitics—manifesting as unintended inductance, capacitance, or resistance—originate from component characteristics, PCB layout, and probing configurations. Under fast-switching conditions typical of WBG devices, such parasitics distort transient responses, compromising measurement accuracy and potentially inducing instability. This work emphasizes their influence during Double Pulse Testing and proposes an AI/ML-based methodology for optimal shunt resistor selection and waveform reconstruction, enabling designers to mitigate parasitic effects and enhance diagnostic precision.
