Power transistors improvements in the scope of loss reduction result in higher switching speed, higher-voltage ratings and smaller footprint. As a result, characterization setup has to follow transistor trends to provide good measurements. Several measurement issues such as ringing or impact of probe on circuit under test are reported. This work reports a planar V-dot probe and custom design of Rogowski coil to characterize and monitor power devices under high switching speed constrain. After small signal characterization, the sensors are tested inside a Double Pulse Test bench to verify suitability in realistic context. The presented Rogowski coil and V-dot probe have to be adapted for each use case. This paper gives guidelines and advice to use embedded sensors in measurement setup.
