T22 - Gate Driver Circuits

Technical Lecture Session Chair(s)

• ZZ

  Zheyu Zhang

  RPI
• NK

  Narayan Kar

  University of Windsor

Student Session Assistant(s)

• FR

  Flavio Ramos

  University of Calgary

Presentations:

• 1:30 PM - 1:50 PM CT

  An Ultra Compact RGB LED Driver with Only One Off-Chip Component, 97.25% Peak Efficiency, and Nearly Full-Range Color Gamut Coverage
  

  Technical Lecture Presenter: Wangkang Lan (he/him/his) – Southern University of Science and Technology

  Co-Author: Caiyu Tong – Southern University of Science and Technology

  Co-Author: Yuan Gao (he/him/his) – Southern University of Science and Technology
• 1:50 PM - 2:10 PM CT

  Double-Pulse Test Circuit for Four-Quadrant Characterization and Dynamic ON-Resistance Evaluation of Monolithic Bidirectional GaN Switches
  

  Technical Lecture Presenter: Hande Kong – University of Wisconsin-Madison

  Co-Author: Hyeongmeen Baik (he/him/his) – University of Wisconsin Madison

  Co-Author: Jinia Roy – University of Wisconsin-Madison
• 2:10 PM - 2:30 PM CT

  A Temperature-Tolerant, Ultrafast Fault Protection Scheme for GaN HEMTs with PCB-Integrated Rogowski Coil Current Sensors
  

  Technical Lecture Presenter: P T Nandh Kishore (he/him/his) – Indian Institute of Technology Delhi

  Co-Author: Soumya Shubhra Nag, PhD (he/him/his) – Indian Institute of Technology Delhi

  Co-Author: Sumit Kumar Pramanick – Indian Institute of Technology Delhi
• 2:30 PM - 2:50 PM CT

  Method for Determining Switching Timing of Gate Drive Current of Active Gate Driver to Maximize Turn-Off Loss Reduction Under Fixed Vds Overshoot Condition in SiC MOSFETs
  

  Technical Lecture Presenter: Yohei Sukita (he/him/his) – The University of Tokyo

  Co-Author: Toshiaki Inuma – The University of Tokyo

  Co-Author: Michihiro Ide – The University of Tokyo

  Co-Author: Kenichi Morokuma – Mitsubishi Electric Corporation

  Co-Author: Yukihiko Wada – Mitsubishi Electric Corporation

  Co-Author: Yuta Yamaoka – Mitsubishi Electric Corporation

  Co-Author: Yasushige Mukunoki – Mitsubishi Electric Corporation

  Co-Author: Makoto Takamiya – The University of Tokyo
• 2:50 PM - 3:10 PM CT

  Single-Step Dead Time Optimization Based on Gate-Source Voltage Sensing
  

  Technical Lecture Presenter: Hongming Zhao – Robert Bosch GmbH & KU Leuven

  Co-Author: Krishang Agarwal – Robert Bosch GmbH

  Co-Author: Joachim Joos – Robert Bosch GmbH

  Co-Author: Valentijn De Smedt – KU Leuven
• 3:40 PM - 4:00 PM CT

  A Novel Signal-Power Integrated Gate Driver Design for Mv SST Applications
  

  Technical Lecture Presenter: Wenjie Xu, PhD – PolyU

  Co-Author: Junwei Liu – PolyU

  Co-Author: Taiming Chen – PolyU

  Co-Author: Yi Zhang (he/him/his) – Hong Kong Polytechnic University

  Co-Author: Henry Shu-Hung Chung – City University of Hong Kong
• 4:00 PM - 4:20 PM CT

  A Self-Regulating Gate Driver with Low-Voltage MOSFETs for Switching Overshoot Suppression of SiC MOSFET
  

  Technical Lecture Presenter: Changwei Lei (he/him/his) – Zhejiang University

  Co-Author: Hengyu Wang – Zhejiang University

  Co-Author: Zixuan Zheng – Zhejiang University

  Co-Author: Chengyuan Zhou (he/him/his) – Zhejiang University

  Co-Author: Xuanyu Jin (he/him/his) – Zhejiang University

  Co-Author: Kuang Sheng – College of Electrical Engineering Zhejiang University
• 4:20 PM - 4:40 PM CT

  An Improved Gate Drive Methodology for Stacked GaNFETs in a Radiation-Tolerant High-Voltage Bidirectional Pulser
  

  Technical Lecture Presenter: Robert E. Bolanos – Southwest Research Institute

  Co-Author: Reynaldo S. Gonzalez, PhD – Southwest Research Institute
• 4:40 PM - 5:00 PM CT

  Active Gate Driver with Controllable Drain-to-Gate Capacitive Coupling for Voltage Overshoot Reduction in SiC MOSFETs
  

  Technical Lecture Presenter: Niklas Falkenberg, MSc (he/him/his) – Chair of Energy Conversion, TU Dortmund

  Co-Author: Martin Pfost – Technische Universität Dortmund