Wolfspeed
Dr. Donald A. Gajewski is the Sr. Director of Reliability Science & Technology for Wolfspeed, Inc, since 2010. He currently supports silicon carbide MOSFETs, Schottky diodes, and power modules for power electronic conversion applications. He has been in the semiconductor industry reliability profession for 25 years. He completed a National Research Council Postdoctoral Research Fellowship at the National Institute of Standards and Technology, in the Semiconductor Electronics Division, in Gaithersburg, MD. He earned the Ph.D. in physics from the University of California, San Diego, partially thanks to a National Science Foundation Fellowship. He is the chair of the JEDEC JC-70 Task Group on Standards for SiC Reliability & Qualification Procedures. He serves on technical/organizing committees for the IRPS and ICSCRM conferences. In his spare time, he coaches soccer, basketball, and track & field for Special Olympics, North Carolina.
D25.8 - Lifetime of Wolfspeed SiC Discrete MOSFETs Under Power Cycling Stress
Thursday, March 26, 2026
12:00 PM - 1:45 PM CT