Yuan Qin

Center for Power Electroncis Systems, Virginia Tech

Presentation(s):

• D25.3 - Robustness of SiC and GaN Diodes Under Extreme dv/dt Stress Up to 980 V/Ns

  Monday, March 23, 2026
  12:00 PM - 1:30 PM CT

• D25.3 - Robustness of SiC and GaN Diodes Under Extreme dv/dt Stress Up to 980 V/Ns

  Thursday, March 26, 2026
  12:00 PM - 1:45 PM CT