Tektronix
Alexander Pronin, PhD, is a Senior Engineer with over 35 years of experience in semiconductor test and measurement technologies. He has extensive expertise in DC, low-current, capacitance–voltage (CV), pulse, and RF measurement applications, as well as in semiconductor characterization methods used to monitor and optimize wafer-level manufacturing processes. Since joining Keithley Instruments (now part of Tektronix) in 1996, he has played a key role in integrating advanced parametric and characterization systems with emerging test capabilities, including high-speed pulse and RF techniques.
Dr. Pronin has developed a broad range of wafer-level reliability (WLR) tests, with emphasis on new failure mechanisms. His work also includes comprehensive characterization packages for next-generation non-volatile memory technologies, including PRAM, ReRAM, FeRAM, and FLASH. In RF characterization, he created an S-parameter measurement application with fully automated RF calibration.
His recent interests include power-device characterization, especially capacitance behavior and dynamic testing at the wafer level. Dr. Pronin holds a PhD from Dartmouth College and an MS from the Moscow Institute of Physics and Technology.
IS18.5 - Forced Current Quasistatic C-V Technique for SiC Devices
Wednesday, March 25, 2026
3:40 PM - 4:05 PM CT