IS23 - Reliability: From Stress to Strength: Physics-Based Reliability for Next-Generation GaN Power Systems

Industry Session Chair(s)

• 

  Ada Cheng (she/her/hers)

  AdaClock
• ES

  Eric Swenson (he/him/his)

  IBM

Student Session Assistant(s)

• ZG

  Zhengchen Guo

  Auburn University

Presentations:

• 8:20 AM - 8:45 AM CT

  Mission Profile-driven Reliability Assessment of Leading-edge GaN for AI Data Center Applications
  

  Industry Session Presenter: Shengke Zhang – EPC Co.
• 8:45 AM - 9:10 AM CT

  Engineering Reliability in Critical High-Voltage Power Applications
  

  Industry Session Presenter: Hafiz Khalid – XP Power
• 9:10 AM - 9:35 AM CT

  Electronics in a Deep Ocean Environment. Effects of Pressure on Electronics and Things to Consider During the Design Phase
  

  Industry Session Presenter: Haskell J. Fought (he/him/his) – Sensors & Systems Solutions, LLC; University of South Carolina
• 9:35 AM - 10:00 AM CT

  Joint GaN Technology Study
  

  Industry Session Presenter: Elona Lala, MSc – IBM