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    Technical Lecture
    Lecture

    T04 - GaN Devices

    Tuesday, March 24, 2026
    8:30 AM - 12:00 PM CT
    Location: 214D

    Presentations:

    • 8:30 AM - 8:50 AM CT
      Comparison of Dynamic ON-Resistance of E-Mode and D-Mode High-Voltage GaN HEMTs in Continuous-Run Operation

      Technical Lecture Presenter: Behzad Poorali Riabi, PhD (he/him/his) – Infineon Technologies

      Co-Author: Tiziano Pastore – Infineon Technologies

      Co-Author: Zhemin Zhang – Infineon

    • 8:50 AM - 9:10 AM CT
      Dynamic Threshold Voltage of Low-Voltage Schottky-Type p-GaN Gate HEMT in Soft-Switching Operation

      Technical Lecture Presenter: Yuwei Wu (she/her/hers) – The Hong Kong University of Science and Technology

      Co-Author: Longge Deng – The Hong Kong University of Science and Technology

      Co-Author: Junting Chen – The Hong Kong University of Science and Technology

      Co-Author: Zongjie Zhou (he/him/his) – The Hong Kong University of Science and Technology

      Co-Author: Ji Shu, Dr. (he/him/his) – HKUST

      Co-Author: Kevin Jing Chen – The Hong Kong University of Science and Technology

    • 9:10 AM - 9:30 AM CT
      Dynamic On-Resistance and Dynamic Threshold Voltage of GaN-on-Si HEMTs with Varying Substrate Connections in Steady-State Hard Switching

      Technical Lecture Presenter: Hongchang Cui (he/him/his) – University of Hong Kong

      Co-Author: Xin Yang (he/him/his) – Department of Electrical and Electronic Engineering, The University of Hong Kong

      Co-Author: Zineng Yang – The University of Hong Kong

      Co-Author: Hengbo Zhang – Department of Electrical and Electronic Engineering, The University of Hong Kong

      Co-Author: Hehe Gong – The University of Hong Kong

      Co-Author: Yuhao Zhang – University of Hong Kong

    • 9:30 AM - 9:50 AM CT
      Reliability Investigation of p-GaN Gates in GaN HEMTs Under Dynamic Switching Conditions

      Technical Lecture Presenter: Angel E. Espinoza – EPC Co.

      Co-Author: Ricardo Garcia (he/him/his) – EPC Co.

      Co-Author: Shengke Zhang – EPC Co.

      Co-Author: Siddhesh Gajare – EPC Co.

      Co-Author: Peter Tieu – EPC Co.

    • 9:50 AM - 10:10 AM CT
      Novel Internal Gate-to-Gate Crosstalk Phenomenon in Monolithic Bidirectional GaN-on-Si HEMTs

      Technical Lecture Presenter: Hongchang Cui (he/him/his) – University of Hong Kong

      Co-Author: Haozhe Jin – University of Hong Kong

      Co-Author: Jian Guo – University of Hong Kong

      Co-Author: Yuhao Zhang – University of Hong Kong

    • 10:40 AM - 11:00 AM CT
      Eliminating Asynchronous Switching in Parallel GaN HEMTs Through Delay Compensation for Equal Current Sharing

      Technical Lecture Presenter: Kaushik Basu – Indian Institute of Science (IISc) Bengaluru

      Co-Author: Harish S (he/him/his) – Indian Institute of Science, Bangalore

      Co-Author: Manish Mandal (he/him/his) – Indian Institute of Science Bangalore

    • 11:00 AM - 11:20 AM CT
      Evaluation and Application of Kilovolt GaN-on-Sapphire Diode Ic

      Technical Lecture Presenter: Zineng Yang – The University of Hong Kong

      Co-Author: Xin Yang (he/him/his) – Department of Electrical and Electronic Engineering, The University of Hong Kong

      Co-Author: Hongchang Cui (he/him/his) – University of Hong Kong

      Co-Author: Hehe Gong – The University of Hong Kong

      Co-Author: Yuan Qin – The Virginia Polytechnic Institute and State University

      Co-Author: Hengbo Zhang – Department of Electrical and Electronic Engineering, The University of Hong Kong

      Co-Author: Yuhao Zhang – University of Hong Kong

    • 11:20 AM - 11:40 AM CT
      Design, Performance, and Htol Evaluation of a Monolithic 100 V / 25 A GaN IC Module

      Technical Lecture Presenter: Öncü Benli Marin Palomo, MSc (she/her/hers) – MinDCet NV.

      Co-Author: Philippe Billet – MinDCet NV.

      Co-Author: Jef Thone – MinDCet NV

      Co-Author: Mert Önkol – MinDCet NV.

      Co-Author: Olga Syshchyk – IMEC

      Co-Author: Ali Roshanghias – Silicon Austria Labs

      Co-Author: Kaneeze Noorul Ain – Silicon Austria Labs

      Co-Author: Mike Wens – MinDCet NV.

    • 11:40 AM - 12:00 PM CT
      High-Frequency Characterization of Coss Loss and Dynamic Rdson in Gan

      Technical Lecture Presenter: Mansi Vipul Joisher (she/her/hers) – Massachusetts Institute of Technology

      Co-Author: Matthew De Jesus – Massachusetts Institute of Technology

      Co-Author: Carlos Sanchez – Massachusetts Institute of Technology

      Co-Author: David Perreault – Massachusetts Institute of Technology