Yifei Huang

Center for Advanced Semiconductors and Integrated Circuits (CASIC)

Presentation(s):

• D25.4 - In-Situ Characterization of Bipolar Stability in SiC and GaN p–n Diodes Over Stress Times from 10^-5 to 10^3 S

  Thursday, March 26, 2026
  12:00 PM - 1:45 PM CT