Yifei Huang

Center for Advanced Semiconductors and Integrated Circuits (CASIC)

Presentation(s):

• D25.4 - In-situ Characterization of Forward Stability in SiC and GaN Diodes Over Stress Times from 10⁻⁵ to 103³ S

  Thursday, March 26, 2026
  12:00 PM - 1:45 PM CT