Purushottam Khadka

RPI

Presentation(s):

• D15.6 - Characterization and Comparison of Isolated Gate Driver ICs Considering Diverse Techniques for Cryogenic Applications

  Monday, March 23, 2026
  12:00 PM - 1:30 PM CT

• T12.2 - Body-Diode Reliability Characterization of Silicon Carbide MOSFETs Toward a Degradation-Insensitive Online Junction Temperature Monitoring

  Wednesday, March 25, 2026
  8:50 AM - 9:10 AM CT

• D04.6 - Reliability Characterization of GaN HEMTs Under Extreme Temperature Cycling for Space Power Applications

  Thursday, March 26, 2026
  12:00 PM - 1:45 PM CT

• D15.6 - Characterization and Comparison of Isolated Gate Driver ICs Considering Diverse Techniques for Cryogenic Applications

  Thursday, March 26, 2026
  12:00 PM - 1:45 PM CT

• D29.8 - A Computationally Efficient Method of Power Module Junction Temperature Estimate Considering Ripple Elements for Yearlong Reliability Simulation of Power Electronics Converters

  Thursday, March 26, 2026
  12:00 PM - 1:45 PM CT