The Ohio State University
T12.3 - Technique for the Accurate Measurement of Average dv/dt of SiC MOSFET
Wednesday, March 25, 20269:10 AM - 9:30 AM CT
D25.5 - Switching Loss Characterization with Uncertainty Quantification for 3.3 kV Monolithic Versus Discrete SiC Bidirectional FETs
Thursday, March 26, 202612:00 PM - 1:45 PM CT
